Thin film characterization by atomic force microscopy at ultrasonic frequencies

This publication has 10 references indexed in Scilit:

• Pulsed force mode: a new method for the investigation of surface properties
  Surface and Interface Analysis, 1999
• Automated parallel high-speed atomic force microscopy
  Applied Physics Letters, 1998
• Quantitative elasticity evaluation by contact resonance in an atomic force microscope
  Applied Physics A, 1998
• Vibrations of free and surface-coupled atomic force microscope cantilevers: Theory and experiment
  Review of Scientific Instruments, 1996
• Scanning microdeformation microscopy in reflection mode
  Applied Physics Letters, 1996
• Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope
  Japanese Journal of Applied Physics, 1993
• Using force modulation to image surface elasticities with the atomic force microscope
  Nanotechnology, 1991
• Contact elasticity in the presence of capillary condensation
  Journal of Colloid and Interface Science, 1990
• Atomic force microscopy of polymeric liquid films
  The Journal of Chemical Physics, 1989
• Atomic Force Microscope
  Physical Review Letters, 1986