Electromagnetic field enhancement in the context of apertureless near-field microscopy
- 4 March 1999
- journal article
- Published by Elsevier in Optics Communications
- Vol. 161 (1-3) , 156-162
- https://doi.org/10.1016/s0030-4018(98)00682-8
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Enhanced sensitivity near-field scanning optical microscopy at high spatial resolutionApplied Physics Letters, 1998
- Nonlinear optics of random metal-dielectric filmsPhysical Review B, 1998
- Direct observation of surface polariton localization caused by surface roughnessOptics Communications, 1995
- Plasmon resonances and near-field optical microscopy: a self-consistent theoretical modelApplied Optics, 1992
- Scanning plasmon near-field microscopePhysical Review Letters, 1992
- Surface-enhanced Raman scattering. The present statusPhysics Reports, 1990
- Observation of Single-Particle Plasmons by Near-Field Optical MicroscopyPhysical Review Letters, 1989
- Surface-enhanced spectroscopyReviews of Modern Physics, 1985
- Local-field enhancement on rough surfaces of metals, semimetals, and semiconductors with the use of optical second-harmonic generationPhysical Review B, 1984
- Radiation Damping in Surface-Enhanced Raman ScatteringPhysical Review Letters, 1982