How seriously do you take possible-detect faults?

This publication has 7 references indexed in Scilit:

• Testing "untestable" faults in three-state circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Compact test sets for industrial circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• I DDQ testing as a component of a test suite: The need for several fault coverage metrics
  Journal of Electronic Testing, 1992
• A generalized fault simulator for combinational logic circuits
  Computers and Electrical Engineering, 1989
• Pseudorandom Testing
  IEEE Transactions on Computers, 1987
• Test Length in a Self-Testing Environment
  IEEE Design & Test of Computers, 1985
• On Random Pattern Test Length
  IEEE Transactions on Computers, 1984