Critical thickness of thin liquid films: Theory and experiment
- 1 September 1983
- journal article
- Published by Elsevier in Journal of Colloid and Interface Science
- Vol. 95 (1) , 254-265
- https://doi.org/10.1016/0021-9797(83)90094-2
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- Spectroscopic parameters for computation of van der waals forcesJournal of Colloid and Interface Science, 1981
- The van der Waals interaction for liquid water: A comparison of the oscillator model approximation and use of the Kramers—Kronig equation with full spectral dataJournal of Colloid and Interface Science, 1977
- Calculations of van der Waals forces in thin liquid films using Lifshitz' theoryJournal of Colloid and Interface Science, 1977
- Effect of surfactant concentration on the critical thicknesses of liquid filmsColloid and Polymer Science, 1974
- Theory of the critical thickness of rupture of thin liquid filmsTransactions of the Faraday Society, 1970
- Critical thickness of rupture of chlorbenzene and aniline filmsTransactions of the Faraday Society, 1968
- Thin liquid filmsAdvances in Colloid and Interface Science, 1967
- Possible mechanism for the spontaneous rupture of thin, free liquid filmsDiscussions of the Faraday Society, 1966
- Über den elektrostatischen und van der Waalsschen zusätzlichen Druck in wässerigen SchaumfilmenColloid and Polymer Science, 1960
- über das Ausfließen der Lösung aus SchaumfilmenColloid and Polymer Science, 1957