Highly reliable non-hermetic InP-based lasers and photodiodes for telecommunication

Publisher Website

19 November 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/drc.1995.496304

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Purging: A reliability assurance technique for new technology semiconductor devices
IEEE Electron Device Letters, 1983