A comparison of a theoretical model and sensitivity factor calculations for quantification of sims data
- 31 January 1978
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 26 (1) , 61-76
- https://doi.org/10.1016/0020-7381(78)80005-9
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Evaluation of the local thermal equilibrium model for quantitative secondary ion mass spectrometric analysisAnalytical Chemistry, 1976
- Lattice influence on ion emission under oxygen bombardmentInternational Journal of Mass Spectrometry and Ion Physics, 1976
- A quantitative model for the interpretation of secondary ion mass spectra of dilute alloysInternational Journal of Mass Spectrometry and Ion Physics, 1975
- Ion microprobe analysers. History and outlookAnalytical Chemistry, 1974
- The application of nonequilibrium surface ionization to the emission of secondary ionsInternational Journal of Mass Spectrometry and Ion Physics, 1973
- Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectraAnalytical Chemistry, 1973
- Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline TargetsPhysical Review B, 1969
- Quantitative Spark Source Mass Spectrometry Using Cryosorption Pumping.Analytical Chemistry, 1965
- Isotope Dilution Analyses by Spark Source Mass Spectrography.Analytical Chemistry, 1965
- Quantitative Mass Spectrometry of Solids.Analytical Chemistry, 1963