Reliability of Gold Metallized Commercially Available Power GaAs FETs
- 1 April 1979
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
- p. 156-160
- https://doi.org/10.1109/irps.1979.362886
Abstract
No abstract availableThis publication has 0 references indexed in Scilit: