Calculation of Pore Size Distribution in the Ellipsometric Porosimetry: Method and Reliability
- 1 January 1999
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Oxide-Assisted Semiconductor Nanowire GrowthMRS Bulletin, 1999
- Characterization of the Pore Structure of MembranesMRS Bulletin, 1999
- Nondestructive Determination of Pore Size Distribution in Thin Films Deposited on Solid SubstratesElectrochemical and Solid-State Letters, 1999
- Porous structure of SiO2 films synthesized at low temperature and pressureThin Solid Films, 1989