Pulsed Characterization Of X-band GaAs DDR INPATT Diodes

• 23 March 2005
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 146-148
• https://doi.org/10.1109/mwsym.1982.1130641

Abstract

Keywords

• GALLIUM ARSENIDE
• DIODES
• PULSE MEASUREMENTS
• IMPEDANCE MEASUREMENT
• PULSE AMPLIFIERS
• RADIO FREQUENCY
• TIME MEASUREMENT
• FIXTURES
• POWER MEASUREMENT
• PHASE MEASUREMENT