Thin-crystal approximations in structure imaging

• 1 July 1981
• journal article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A
• Vol. 37  (4) , 465-471
• https://doi.org/10.1107/s0567739481001137

Abstract

Keywords

• STRUCTURE IMAGES
• TRANSFER FUNCTION
• SILICON
• CHARGE DENSITY
• CRYSTAL
• POTENTIAL DISTRIBUTION
• BEAM
• PROJECTED
• INCIDENT