Atomic force microscopy—a powerful tool for industrial applications
- 20 May 1999
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 27 (5-6) , 401-409
- https://doi.org/10.1002/(sici)1096-9918(199905/06)27:5/6<401::aid-sia533>3.0.co;2-a
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- AFM and TEM investigations of polypropylene/polyurethane blendsThin Solid Films, 1995
- Polymer MicroscopyPublished by Springer Nature ,1987
- Morphology of crystalline polyurethane hard segment domains and spherulitesPolymer, 1980