Diamagnetic Susceptibility of Tetrahedral Semiconductors

Abstract
The lattice contribution to the diamagnetic susceptibility, χL, is written as a sum of three terms, a core term χc, a Langevin-like valence-electron contribution χv, and a Van Vleck paramagnetic term χp using a one-oxcillator model. Measurements of χL and dχLdT for diamond, Si, Ge, GaAs, and GaP are presented. The model allows a separate determination of each of the three terms and relates these terms to the symmetry and extent of the valence-bond charge distribution.

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