Schottky barriers at/Si(111) interfaces
- 15 July 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 42 (3) , 1696-1704
- https://doi.org/10.1103/physrevb.42.1696
Abstract
The electronic structures of the two types of /Si(111) interface were studied within the local-density approximation using the linear muffin-tin orbitals method in the atomic-sphere approximation. Calculations were done for four supercell sizes. The largest supercell contained 12 layers and 11 layers. With each large supercell, the difference between the Schottky-barrier heights (SBH’s) of the two types of interface was consistent with experimental values. However, SBH’s depend on the supercell size, although larger supercells have enough layers to screen the interface disturbance. Why SBH’s depend on the cell size is investigated.
Keywords
This publication has 35 references indexed in Scilit:
- On the formation of semiconductor interfacesJournal of Physics C: Solid State Physics, 1987
- Schottky barriers and semiconductor band structuresPhysical Review B, 1985
- Schottky-Barrier Formation at Single-Crystal Metal-Semiconductor InterfacesPhysical Review Letters, 1984
- Schottky Barrier Heights and the Continuum of Gap StatesPhysical Review Letters, 1984
- Formation of Ultrathin Single-Crystal Silicide Films on Si: Surface and Interfacial Stabilization of Si-NiEpitaxial StructuresPhysical Review Letters, 1983
- The metal-semiconductor interface: Si (111) and zincblende (110) junctionsJournal of Physics C: Solid State Physics, 1977
- Electronic structure of a metal-semiconductor interfacePhysical Review B, 1976
- Theory of Surface StatesPhysical Review B, 1965
- Surface States and Rectification at a Metal Semi-Conductor ContactPhysical Review B, 1947
- Vereinfachte und erweiterte Theorie der Randschicht-gleichrichterThe European Physical Journal A, 1942