Polarization Phenomena in X-Ray Scattering
- 3 April 1978
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 40 (14) , 957-960
- https://doi.org/10.1103/physrevlett.40.957
Abstract
Rotation of the plane of polarization of a linearly polarized x-ray beam by simple transmission through a (110) silicon crystal has been observed. Both the amount of rotation and the amount of absorption of x rays depend on the orientation of the crystal in the incident beam. Contemporary scattering-theory calculations are used to explain this effect, including the x-ray analog to optical birefringence, for a suitable crystal sample.Keywords
This publication has 3 references indexed in Scilit:
- Asymmetric crystal topographic cameraReview of Scientific Instruments, 1976
- The Polarization Mixing of X-RaysJournal of the Physics Society Japan, 1966
- Quantum Theory of X-Ray Diffraction by a CrystalJournal of the Physics Society Japan, 1966