Effects of Weibull hazard rate on common cause failure analysis of reliability networks
- 1 January 1978
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 17 (1) , 59-65
- https://doi.org/10.1016/0026-2714(78)91138-1
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Common mode failure analysisIEEE Transactions on Power Apparatus and Systems, 1975