An X-ray spectrometer for inelastic scattering experiments. II. Spectral flux and resolution
- 1 October 1986
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 19 (5) , 343-352
- https://doi.org/10.1107/s0021889886089240
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: