Thickness gauging through the ratio of x-ray fluorescence lines
- 1 May 1975
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 27 (1) , 141-147
- https://doi.org/10.1016/0040-6090(75)90016-4
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A General Approach to the Design of Radiation GaugesNuclear Technology, 1974
- Gamma Gauge for the Control of Interzone Layer in an Extraction TowerNuclear Technology, 1974