Analysis of shielded coplanar waveguide step discontinuity considering the finite metallization thickness effect

9 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

No. 0149645X,p. 473-475
https://doi.org/10.1109/mwsym.1991.147039

Abstract

The mode-matching technique is applied to analyze the shielded coplanar waveguide (CPW) step discontinuity. The effect of the finite thickness of the CPW center strip and ground planes is also considered. Results on the frequency-dependent scattering parameters of the shielded CPW step discontinuity incorporating the finite metallization thickness effect are presented.

Keywords

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