Conduction and Hall measurements offilms at high temperatures: The role of oxygen
- 1 August 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 38 (4) , 2828-2831
- https://doi.org/10.1103/physrevb.38.2828
Abstract
We report new resistance and Hall effect measurements for . The data were taken at temperatures up to 1100 K, and at various oxygen partial pressures. For K, the resistivity shows an activated temperature dependence, and a square-root pressure dependence. Measurements of oxygen content in the literature, however, show a dependence on pressure that is much weaker than square root. For the measurements of resistivity and oxygen content to be consistent, the mechanism for conduction at high temperatures is likely to be hopping. Our experiments are the first to show that the linear temperature dependence of the effective Hall carrier density persists up to ≃ 700 K and then drops.
Keywords
This publication has 16 references indexed in Scilit:
- Hall coefficient and oxygen stoichiometry inceramics at elevated temperaturesPhysical Review B, 1988
- Transport mechanisms in superconductors in the metallic and the semiconducting regimesPhysical Review B, 1988
- I n s i t u resistance of Y1Ba2Cu3Ox films during annealApplied Physics Letters, 1988
- Hole formation in orthorhombic and tetragonalPhysical Review B, 1987
- Effect of oxygen desorption on electrical transport inPhysical Review B, 1987
- Hall effect of the high Tc superconducting Y-Ba-Cu-O compoundSolid State Communications, 1987
- Measurement of anisotropic resistivity and Hall constant for single-crystalPhysical Review Letters, 1987
- High-temperature order-disorder phase transition in the superconductor observed by electrical resistivity measurementsPhysical Review B, 1987
- Comparisons of Transport Properties, Electron Deficiency and Superconducting Tcin the La2-xSrxCuO4-δsystem and YBa2Cu3O9-δAdvanced Ceramic Materials, 1987
- Direct observation of electronic anisotropy in single-crystalPhysical Review Letters, 1987