Electronic transitions and excitations in solidstudied by EELS and XPS C 1ssatellite structures
- 15 March 1995
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 51 (11) , 7179-7185
- https://doi.org/10.1103/physrevb.51.7179
Abstract
The electronic transition and excitation properties of highly ordered films have been studied by reflection electron-energy-loss spectroscopy (EELS) and x-ray photoemission spectroscopy (XPS) C 1s satellite structures. The EELS study revealed a total of 11 features in the energy-loss range 1–40 eV. These include two tight-binding Frenkel excitonic levels in fullerite, at 1.53 and 1.88 eV; the feature at 2.20 eV correlated with the onset of the electron transitions between the highest occupied molecular-orbital- and lowest occupied molecular-orbital-derived bands; a doublet at around 6 eV showing evidence of the π-plasmon splitting of fullerite . A broad hump at ∼28 eV corresponds to the excitation of the (σ+π) plasmon. The XPS C 1s satellite structures were found to be in overall agreement with the EELS results in the corresponding energy-loss range. By comparing the EELS data with the direct and inverse photoemission data, the on-site Coulomb correlation energy has been determined to be 1.2±0.2 eV for fullerite.
Keywords
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