High-Resolution Scanning Transmission Electron Microscopy
- 22 July 1983
- journal article
- research article
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 221 (4608) , 325-330
- https://doi.org/10.1126/science.6867711
Abstract
The high-resolution scanning transmission electron microscope is being used in a growing number of laboratories. This article provides a general overview of the instrument and its capabilities.This publication has 12 references indexed in Scilit:
- On the optimum resolution for a corrected STEMUltramicroscopy, 1982
- Orientation-dependent extended fine structure in electron-energy-loss spectraPhysical Review B, 1982
- A “stand alone” image processing system for STEM imagesUltramicroscopy, 1982
- The physics of the high-resolution scanning microscopeReports on Progress in Physics, 1980
- Uniqueness and the inversion problem of incoherent multiple scatteringUltramicroscopy, 1979
- Inner-Shell Electron Spectroscopy for MicroanalysisScience, 1979
- Reconstruction of glutamine synthetase using computer averagingUltramicroscopy, 1978
- Molecular structure determination by electron microscopy of unstained crystalline specimensJournal of Molecular Biology, 1975
- A scanning microscope with 5 Å resolutionJournal of Molecular Biology, 1970
- ber einige Fehler von ElektronenlinsenThe European Physical Journal A, 1936