Scanning SQUID microscopy of integrated circuits
- 17 April 2000
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 76 (16) , 2304-2306
- https://doi.org/10.1063/1.126327
Abstract
We have used a scanning YBa 2 Cu 3 O 7 superconducting quantum interference device(SQUID) at 77 K to image currents in room-temperature integrated circuits. We acquired magnetic field data and used an inversion technique to convert the field data to a two-dimensional current density distribution, allowing us to locate current paths. With an applied current of 1 mA at 3 kHz, and a 150 μm separation between the sample and the SQUID, we found a spatial resolution of 50 μm in the converted current density images. This was about three times smaller than the SQUID–sample separation, i.e., three times better than the standard near-field microscopy limit, and about 10 times sharper than the raw magnetic field images.Keywords
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