Technique for measuring the dielectric constant of thin materials
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 37 (4) , 631-636
- https://doi.org/10.1109/19.9828
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Measuring and modeling the backscattering cross section of a leafRadio Science, 1987
- Microwave Dielectric Spectrum of Vegetation - Part II: Dual-Dispersion ModelIEEE Transactions on Geoscience and Remote Sensing, 1987
- Microwave Dielectric Spectrum of Vegetation-Part I: Experimental ObservationsIEEE Transactions on Geoscience and Remote Sensing, 1987
- An impedance sheet approximation for thin dielectric shellsIEEE Transactions on Antennas and Propagation, 1975