Edge detection in micrometrology with nearly confocal microscopy
- 1 March 1984
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 23 (5) , 657-658
- https://doi.org/10.1364/ao.23.000657
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Improvement in resolution by nearly confocal microscopyApplied Optics, 1982
- Image Formation in the Scanning MicroscopeOptica Acta: International Journal of Optics, 1977