Electron beam potential depression as an ion trap in Fourier transform ion cyclotron resonance mass spectrometry
- 10 February 1995
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 141 (2) , 161-170
- https://doi.org/10.1016/0168-1176(94)04105-g
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
- Fourier transform mass spectrometryMass Spectrometry Reviews, 1992
- Fourier transform ion cyclotron resonance mass spectrometry: the teenage yearsAnalytical Chemistry, 1991
- The Electron Beam Ion Trap: A New Instrument for Atomic Physics MeasurementsPhysica Scripta, 1988
- Trapping of positive ions in the electron beam of an ion cyclotron resonance spectrometerInternational Journal of Mass Spectrometry and Ion Physics, 1978
- Biomolecular reactions of trapped ions. IV. Reactions in gaseous ethane and mixtures with acetylene and methane-d4Journal of the American Chemical Society, 1972
- Bimolecular reactions of ions trapped in an electron space chargeInternational Journal of Mass Spectrometry and Ion Physics, 1970
- A technique for ion-trapping in pulsed-source mass spectrometryJournal of Physics E: Scientific Instruments, 1968
- MULTIPLE IONIZATION OF THE RARE GASES BY SUCCESSIVE ELECTRON IMPACTS (0–250 eV): I. APPEARANCE POTENTIALS AND METASTABLE ION FORMATIONCanadian Journal of Physics, 1967
- Electron collision studies with trapped positive ionsPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1966
- Space Charge Neutralization in the Ionizing Beam of a Mass SpectrometerReview of Scientific Instruments, 1957