The geometric factor in semiconductor four-probe resistivity measurements
- 23 September 1963
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 6 (5) , 459-462
- https://doi.org/10.1016/0038-1101(63)90030-3
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Four-probe resistivity measurements on small circular specimensBritish Journal of Applied Physics, 1961
- Measurement of the Sheet Resistivity of a Square Wafer with a Square Four-Point ProbeReview of Scientific Instruments, 1960
- Measurement of Sheet Resistivities with the Four-Point ProbeBell System Technical Journal, 1958
- The Potentials of Infinite Systems of Sources and Numerical Solutions of Problems in Semiconductor EngineeringBell System Technical Journal, 1955