Electrical transport properties of p-type Pb1−xCdxTe thin films
- 1 June 1981
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 52 (6) , 4095-4097
- https://doi.org/10.1063/1.329260
Abstract
Hall coefficient and dc conductivity measurements have been made in the temperature range 77–500 K on thin exptaxial films of p‐type Pb1‐xCd xTe, grown by vacuum evaporation using a three‐temperature technique. It has been found that the principal band gap and the mobility ratio of electron to hole increases with the increase of x. Increase of x is found to increase Te vacancies in the films which act as donors. In the low‐temperature region, the ionised impurity scattering is found to be predominant, while the phonon scattering is found to limit the mobility of the charge carries at higher temperatures.This publication has 7 references indexed in Scilit:
- Voltage readout of a temperature-controlled thin film thickness monitorJournal of Physics E: Scientific Instruments, 1977
- Energy-gap variations in semiconductor alloysJournal of Physics C: Solid State Physics, 1974
- Properties of CdxPb1−xTe thin filmsThin Solid Films, 1973
- Transport properties of the CdxPb1$minus$x Te alloy systemJournal of Physics D: Applied Physics, 1971
- Electronic Structures of Semiconductor AlloysPhysical Review B, 1970
- Solid solutions of CdSe and CdTe in PbTe and their optical propertiesBritish Journal of Applied Physics, 1966
- Anomalies of Electrical Properties of Lead Telluride CrystalJournal of the Physics Society Japan, 1957