Two-dimensional p n-junction delineation on cleaved silicon samples with an ultrahigh vacuum scanning tunneling microscope
- 1 January 1992
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 10 (1) , 496-501
- https://doi.org/10.1116/1.586382
Abstract
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