A dynamic test method for high-resolution A/D converters
Open Access
- 1 March 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. IM-31 (1) , 3-5
- https://doi.org/10.1109/TIM.1982.6312502
Abstract
A dynamic test method is described for A/D converters having up to 16 bits of resolution. The technique exercises the test converter with stepped input changes, simulating the output of an S/H amplifier. Dynamic errors as low as 4 ppm can be measured within 4 ßs following a step change as large as 20 V.Keywords
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