Gate propagation delay and logic timing of GaAs integrated circuits measured by electro-optic sampling

24 April 1986

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 22 (9) , 499-501
https://doi.org/10.1049/el:19860339

Abstract

We report techniques for measuring internal switching delays of GaAs digital integrated circuits by electro-optic sampling. Circuit propagation delays of 15 ps are measured. A new phase modulation technique which allows testing of sequential logic is demonstrated with the measurement of a 2·7 GHz 8-phase clock generator.

Keywords

PHASE MODULATION TECHNIQUE
TESTING
ELECTRO-OPTIC SAMPLING
GATE PROPAGATION DELAY
III-V SEMICONDUCTORS
LOGIC TIMING
SEQUENTIAL LOGIC
15 PS DELAY
INTERNAL SWITCHING DELAYS
GAAS INTEGRATED CIRCUITS
DIGITAL IC

This publication has 1 reference indexed in Scilit:

A sub-200 picosecond GaAs sample-and-hold circuit for a multi-gigasample/second integrated circuit
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1985