Global and local document degradation models

Publisher Website

30 December 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 730-734
https://doi.org/10.1109/icdar.1993.395633

Abstract

No abstract available

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Depth recovery from blurred edges
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
A New Sense for Depth of Field
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1987