The micromagnetics of defects in film stacks with interlayer exchange coupling
- 1 November 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 29 (6) , 3099-3101
- https://doi.org/10.1109/20.280887
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Giant Magnetoresistance, Antiferromagnetic Volume Fraction And Saturation Field In Co/Cu Multilayers.Published by Institute of Electrical and Electronics Engineers (IEEE) ,1993
- Numerical investigation of 90° exchange-coupling in magnetic multilayersPhysics Letters A, 1992
- Calculation of Magnetization Processes in Multilayers with Antiferromagnetic Coupling between Adjacent LayersMRS Proceedings, 1989