Generation lifetime determination from current voltage or current-time measurements for unknown doping profile
- 31 January 1982
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 25 (1) , 77-78
- https://doi.org/10.1016/0038-1101(82)90099-5
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Non-steady-state studies on MOS devices subject to a linear voltage rampJournal of Applied Physics, 1979
- Non-equilibrium response of MOS devices to a linear voltage ramp—I. Bulk discrete trapsSolid-State Electronics, 1977