Exciton lifetimes in CdTe/CdMnTe single quantum wells

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Abstract
The lifetime of excitons in CdTe/Cd0.75Mn0.25Te single quantum wells (SQW) has been measured by time‐resolved photoluminescence for quantum wells with thicknesses from 34 to 300 Å and in the temperature range from 1.6 to 300 K. The exciton lifetimes are of the order of 150 ps at the lowest temperatures, where radiative recombination dominates. The lifetimes are only weakly dependent on well thickness and decrease from 170 to 140 ps for quantum wells with thickness decreasing from 300 to 34 Å. A comparison with a high quality GaAs/AlGaAs SQW yields comparable luminescence efficiencies at low temperatures, yet the lifetimes are considerably shorter in the CdTe/Cd0.75Mn0.25Te quantum wells due to the higher exciton oscillator strength.