Dynamic Testing of Waveform Recorders
- 1 March 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 32 (1) , 12-17
- https://doi.org/10.1109/tim.1983.4315001
Abstract
Four waveform recorder tests are presented that characterize dynamic performance using sine-wave sources. Each test illuminates different aspects of dynamic performance, and in some cases indicate the specific errors limiting performance. Pitfalls in using the tests are also examined.Keywords
This publication has 1 reference indexed in Scilit:
- New Criterion for Testing Analog-to-Digital Converters for Statistical EvaluationIEEE Transactions on Instrumentation and Measurement, 1973