Observations of fractal patterns induced in thin solid films by ion irradiation

Abstract
The formation of fractal patterns during an amorphous structural transition in Ni-Mo thin films after 200-keV xenon-ion irradiation is presented. The dimension of the ion-induced fractals is 1.72±0.07. The fractal patterns, together with other microscopic features, are described and characterized. Our results are compared to the cluster-diffusion-limited-aggregation model. The growth habit is attributed to long-range correlation which occurs at a critical condition during the amorphous-crystal transition.

This publication has 11 references indexed in Scilit: