Observations of fractal patterns induced in thin solid films by ion irradiation
- 17 August 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 59 (7) , 745-747
- https://doi.org/10.1103/physrevlett.59.745
Abstract
The formation of fractal patterns during an amorphous structural transition in Ni-Mo thin films after 200-keV xenon-ion irradiation is presented. The dimension of the ion-induced fractals is 1.72±0.07. The fractal patterns, together with other microscopic features, are described and characterized. Our results are compared to the cluster-diffusion-limited-aggregation model. The growth habit is attributed to long-range correlation which occurs at a critical condition during the amorphous-crystal transition.Keywords
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