In Situ Investigation of Si-TPA-MFI Crystallization Using (Ultra-) Small- and Wide-Angle X-ray Scattering
- 1 December 1997
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 101 (51) , 11077-11086
- https://doi.org/10.1021/jp9724784
Abstract
No abstract availableKeywords
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