The X-ray-interferometer for high resolution measurement of anomalous dispersion at HASYLAB
- 15 April 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 208 (1-3) , 603-604
- https://doi.org/10.1016/0167-5087(83)91190-0
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Measurement of K-edge dispersion anomalies with the new X-ray interferometer at DORISNuclear Instruments and Methods, 1980
- Application of the Dispersion Relation to Determine the Anomalous Scattering FactorsJapanese Journal of Applied Physics, 1978
- Precise interferometric measurement of the NiK-edge forward scattering amplitude with synchrotron X-raysZeitschrift für Physik B Condensed Matter, 1976