Surface and grain boundary analysis of doped zirconia ceramics studied by AES and XPS
- 1 January 1992
- journal article
- research article
- Published by Springer Nature in Journal of Materials Science
- Vol. 27 (18) , 5057-5066
- https://doi.org/10.1007/bf01105274
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Powder preparation and compaction behaviour of fine-grained Y-TZPJournal of Materials Science, 1990
- A new computer model of grain boundary segregationJournal of Materials Science, 1990
- Segregation Isotherms at the Surfaces of OxidesJournal of the American Ceramic Society, 1989
- XPS study of an intergranular phase in yttria-zirconiaJournal of Materials Science, 1989
- Segregation aspects in the ZrO2-Y2O3 ceramic systemJournal of Materials Science Letters, 1989
- Surface and Grain Boundary Segregation in Metal OxidesPublished by Springer Nature ,1989
- Microstructure and sintering kinetics of highly reactive ZrO2-Y2O3 ceramicsJournal of Materials Science, 1985
- AES/STEM grain boundary analysis of stabilized zirconia ceramicsJournal of Physics and Chemistry of Solids, 1983
- Effect of impurities on sintering and conductivity of yttria-stabilized zirconiaJournal of Materials Science, 1982
- Effective ionic radii in oxides and fluoridesActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1969