Inchworm controller for fine approach in a scanning tunneling microscope

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Abstract
This article addresses the problem of controlling the smooth approach of a scanning tunneling microscope using a commercial ferroelectric tube or ‘‘inchworm’’ device for both coarse and fine adjustment. A circuit is described for adapting the commercial control electronics such that the tip to sample approach time is less than 10 min with a fine control resolution of better than 1 Å to prevent the tip crashing into the surface.

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