Microstructure, resistivity and the anisotropy of the upper critical field in NbN thin films
- 1 March 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 23 (2) , 831-838
- https://doi.org/10.1109/tmag.1987.1065011
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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