XPS—Investigation of contamination layers
- 1 January 1978
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 13 (2) , 91-95
- https://doi.org/10.1016/0368-2048(78)85013-0
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Instrumentation for surface studies: XPS angular distributionsJournal of Electron Spectroscopy and Related Phenomena, 1974
- The Computer Generation of Electron Microscope Pictures of DislocationsAustralian Journal of Physics, 1967