Steady State Gamma Testing of a 4K NMOS Dynamic Ram
- 1 June 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 23 (3) , 1301-1303
- https://doi.org/10.1109/TNS.1976.4328456
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Room Temperature Annealing of Ionizatton-Induced Damage in CMOS CircuitsIEEE Transactions on Nuclear Science, 1973
- Radiation Failure Modes in CMOS Integrated CircuitsIEEE Transactions on Nuclear Science, 1973
- The Effects of Ionizing Radiation on Various CMOS Integrated Circuit StructuresIEEE Transactions on Nuclear Science, 1972