Determination of Crystallisation Parameters of a-Si from In Situ Conductance Measurements and Transmission Electron Microscopy Analysis
- 1 March 1994
- journal article
- Published by Trans Tech Publications, Ltd. in Solid State Phenomena
- Vol. 37-38, 311-316
- https://doi.org/10.4028/www.scientific.net/ssp.37-38.311
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