Dislocation emission from cracks-observations by x-ray topography in silicon
- 30 November 1986
- journal article
- Published by Elsevier in Scripta Metallurgica
- Vol. 20 (11) , 1495-1500
- https://doi.org/10.1016/0036-9748(86)90382-0
Abstract
No abstract availableKeywords
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