A Stable In-Laboratory EXAFS Measurement System

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Abstract
An EXAFS measurement system with two proportional counters has been constructed. One of the counters is for monitoring the incident X-ray intensity, and the other is for measuring the intensity after the X-rays have passed through the specimen, and has an adjustable length. As the intensities before and after the specimen are measured simultaneously, the system is free from fluctuations of the incident X-ray intensity. By adjusting the length of the latter counter, error caused by the counting loss effect at the energy of the characteristic X-rays of impurities contained in the X-ray tube target has been removed. The EXAFS spectrum of Zn sites in amorphous Mg70Zn30 alloy is measured with this system.