Analysis of laser diode thermal properties with spatial resolution by means of the TRAIT method
- 31 March 1997
- journal article
- Published by Elsevier in Microelectronics Journal
- Vol. 28 (3) , 293-300
- https://doi.org/10.1016/s0026-2692(96)00032-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Complete characterisation of laser diode thermal circuit by voltage transient measurementsElectronics Letters, 1993
- Fine structure of heat flow path in semiconductor devices: A measurement and identification methodSolid-State Electronics, 1988
- Decomposition of Compartment Transition Functions by means of the Pade-approximationMathematical Biosciences, 1974