Nondestructive determination of electromagnetic parameters of dielectric materials at X-band frequencies using a waveguide probe system
- 1 January 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 46 (5) , 1084-1092
- https://doi.org/10.1109/19.676717
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Flanged coaxial microwave probes for measuring thin moisture layersIEEE Transactions on Biomedical Engineering, 1992
- Permittivity measurements using a short open-ended coaxial line probeIEEE Microwave and Guided Wave Letters, 1991
- Static analysis of an open-ended coaxial line terminated by layered mediaIEEE Transactions on Instrumentation and Measurement, 1990
- Noninvasive electrical characterization of materials at microwave frequencies using an open-ended coaxial line: test of an improved calibration techniqueIEEE Transactions on Microwave Theory and Techniques, 1990
- Study of radiating properties of open-ended rectangular waveguidesIEEE Transactions on Antennas and Propagation, 1988
- Numerical Analysis of Open-Ended Coaxial LinesIEEE Transactions on Microwave Theory and Techniques, 1983
- Coaxial Line Reflection Methods for Measuring Dielectric Properties of Biological Substances at Radio and Microwave Frequencies-A ReviewIEEE Transactions on Instrumentation and Measurement, 1980
- Nondestructive Measurement of Complex Permittivity for Dielectric Slabs (Short Papers)IEEE Transactions on Microwave Theory and Techniques, 1975
- New variational principle in electromagneticsIEEE Transactions on Antennas and Propagation, 1970
- Admittance of a waveguide radiating into stratified plasmaIEEE Transactions on Antennas and Propagation, 1965