Computation of integrated-circuit yields from the distribution of slice yields for the individual devices

1 June 1968

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices

Vol. 15 (6) , 405-406
https://doi.org/10.1109/T-ED.1968.16198

Abstract

This correspondence calculates the average yield\bar{Y_{N}}forNmultiple devices as a function of the average yield (\bar{Y_{1}}) of single devices assuming several simple forms of distribution function for slice yields. It shows that the usual calculation\bar{Y_{N}}= (\bar{Y_{1}})^{N}is too pessmistic by an appreciable factor even when no "within slice" correlation exists. Using an actual distribution of transistor slice yields, the (\bar{Y_{1}})^{N}calculation is shown to give a yield which is a factor of 5 too low for groups of eight good devices.

Keywords

This publication has 1 reference indexed in Scilit:

Silicon monolithic random pulse generator
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1964