Electron beam ion sources and their development at JINR (invited)
- 1 January 1990
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 61 (1) , 225-229
- https://doi.org/10.1063/1.1141882
Abstract
The principles of action and main types of electron beam ion sources (EBIS) developed in various laboratories are considered. The reasons limiting an ability of EBIS to ionize are discussed. Primary consideration is given to the program of EBIS development at the Joint Institute for Nuclear Research at Dubna. The method of ion-by-ion cooling and preliminary results of its study for increasing the highly charged ion yield and for increasing the charge state of ions are described. The ion-at-surface spectroscopy is shown as a useful diagnostic method of EBIS. Possible prospects for development of EBIS and for its application are pointed out.Keywords
This publication has 2 references indexed in Scilit:
- The Electron Beam Method of Production of Highly Charged Ions and Its ApplicationsPhysica Scripta, 1983
- The Orsay Electron Beam Ion SourceIEEE Transactions on Nuclear Science, 1976